首页> 外文会议>Fifteenth International Symposium on Chemical Vapor Deposition, May 14-18, 2000, Toronto, Ontario >RUTHENIUM DOPED INDIUM PHOSPHIDE GROWTH BY LOW PRESSURE HYDRIDE VAPOR PHASE EPITAXY
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RUTHENIUM DOPED INDIUM PHOSPHIDE GROWTH BY LOW PRESSURE HYDRIDE VAPOR PHASE EPITAXY

机译:低压氢化物蒸气相表观生长的D掺杂磷化铟

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Ruthenium doped InP (InP:Ru) has been grown by low pressure hydride vapor phase epitaxy (LP-HVPE) using bis(η~5-2,4-dimethylpentadienyl) ruthenium(II) as precursor. Ruthenium concentrations in the range 2xl0~(15) to 2xl0~(18) cm~(-3) have been achieved. The Ru incorporation has been studied in terms of incorporation flux and it turns out that the growth rate is limiting the incorporation. From I-V measurements on n/InP:Ru and p/InP:Ru/p structures, resistivities ≥ 10~3Ωcm and ≥ 10~(10)Ωcm have been obtained, respectively.
机译:使用双(η〜5-2,4-二甲基戊二烯基)钌(II)作为前体,通过低压氢化物气相外延(LP-HVPE)生长了掺杂钌的InP(InP:Ru)。钌的浓度范围为2x10〜(15)至2x10〜(18)cm〜(-3)。关于Ru的掺入,根据掺入流量进行了研究,结果表明生长速度限制了掺入。通过对n / InP:Ru / n和p / InP:Ru / p结构进行的I-V测量,分别获得了电阻率≥10〜3Ωcm和≥10〜(10)Ωcm。

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