首页> 外文会议>Electrochemical Society Meeting and International Symposium on Silicon-on-Insulator Technology and Devices XI; 20030428-20030502; Paris; FR >AN ACCURATE MODEL FOR THRESHOLD VOLTAGE AND S-FACTOR OF PARTIALLY-DEPLETED SURROUNDING GATE TRANSISTOR (PD-SGT)
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AN ACCURATE MODEL FOR THRESHOLD VOLTAGE AND S-FACTOR OF PARTIALLY-DEPLETED SURROUNDING GATE TRANSISTOR (PD-SGT)

机译:局部耗尽型门极晶体管门限电压和S因子的精确模型(PD-SGT)

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摘要

This paper proposes an accurate model for threshold voltage and S-factor of Partially-Depleted Surrounding Gate Transistor (PD-SGT) for the first time. Moreover, accurate electric field, potential and depletion region width peculiar to a three-dimensional (3D) cylindrical structure are obtained. The analysis using this model is very usefull for distinction whether the device operates in a Partially-Depleted (PD) or a Fully-Depleted (FD) condition. The results numerically calculated by this model agree well with those of 3D device simulator.
机译:本文首次提出了一种精确的模型,用于部分耗尽型环绕栅晶体管(PD-SGT)的阈值电压和S因子。此外,获得了三维(3D)圆柱结构特有的精确电场,电势和耗尽区宽度。使用此模型进行的分析对于区分设备是否在部分耗尽(PD)或完全耗尽(FD)条件下运行非常有用。通过该模型进行数值计算的结果与3D设备模拟器的结果非常吻合。

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