首页> 外文会议>Electronic Components Technology Conference, 1998. 48th IEEE >Characterization of a no-flow underfill encapsulant during the solder reflow process
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Characterization of a no-flow underfill encapsulant during the solder reflow process

机译:回流焊过程中无流动底部填充胶的特性

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A challenge in flip-chip technology development is to improve the thermo-mechanical reliability of the flip-chip assembly. To increase reliability, an underfill encapsulant is applied to the gap between IC chip and substrate to provide thermal-mechanical protection as well as environmental protection to the assembly. Two processes for applying the underfill encapsulant to the gap between IC chip and substrate can be described as the fast-flow method and the no-flow (reflowable underfill) method. The fast-flow method is currently the most widely used method. The no-flow method is a new innovative method that provides cost savings. In order to develop novel underfill encapsulants for the no-flow process, a better understanding of the underfill properties during the solder reflow is needed. This paper studies two aspects of the No-Flow underfill: fluxing activity and viscosity during reflow. These two aspects are important for proper interconnect formation. Solder wetting studies were conducted by applying the no-flow underfill on top of solder beads on substrates of different metallizations. The samples were then placed in a 7-zone reflow oven on different eutectic type heating cycles. Cross sections of the samples were taken and the angle the solder makes with the substrate was determined. The viscosity of the underfill during reflow is important to allow proper solder interconnects. To acquire the viscosity of the underfill just before, during, and shortly after the solder reflow temperature, a no-flow underfill encapsulant developed at the Georgia Institute of Technology was studied. Samples of this underfill were placed in a 5-zone reflow oven on a standard eutectic cycle and taken out at different points. The samples were then analyzed by differential scanning calorimetry (DSC) to find the % conversion (amount of cure) of the underfill material. These % conversions were then used to find the complex viscosity at different points in the reflow process. In this paper, we present the experimental procedures and results of the No-Flow underfill's fluxing abilities and viscosity during reflow heating conditions.
机译:倒装芯片技术发展中的挑战是提高倒装芯片组件的热机械可靠性。为了提高可靠性,在IC芯片和基板之间的间隙中使用了底部填充密封剂,以为组件提供热机械保护和环境保护。可以将用于将底部填充密封剂施加到IC芯片和衬底之间的间隙的两个过程描述为快速流动方法和不流动(可回流的底部填充)方法。快速流动方法是当前使用最广泛的方法。无流量方法是一种新的创新方法,可节省成本。为了开发用于无流工艺的新型底部填充密封剂,需要对焊料回流期间的底部填充特性有更好的了解。本文研究了No-Flow底部填充的两个方面:助焊活性和回流时的粘度。这两个方面对于正确的互连形成很重要。焊料润湿研究是通过在不同金属化的基板上的焊珠顶部施加无流动底部填充剂来进行的。然后将样品以不同的共晶类型加热周期放置在7区回流炉中。采集样品的横截面,并确定焊料与基材的夹角。回流期间底部填充剂的粘度对于允许正确的焊料互连很重要。为了在焊料回流温度之前,期间和之后不久获得底部填充剂的粘度,研究了佐治亚理工学院开发的无流动底部填充剂。将该底部填充物的样品按标准的共晶循环放置在5区回流炉中,并在不同的位置取出。然后通过差示扫描量热法(DSC)分析样品,以找到底部填充材料的转化率(固化量)。然后将这些%转化率用于在回流过程中的不同点处求出复数粘度。在本文中,我们介绍了在回流加热条件下No-Flow底部填充剂的通量能力和粘度的实验程序和结果。

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