首页> 外文会议>Electronic Components Technology Conference, 1998. 48th IEEE >Comparison of the shear strength and reliability between gold-plated and bare copper lands of a BGA package
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Comparison of the shear strength and reliability between gold-plated and bare copper lands of a BGA package

机译:BGA封装的镀金和裸铜焊盘之间的剪切强度和可靠性的比较

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In this study, we focus on the possibility that the land of bare copper in plastic ball grid array (PBGA hereafter) packages may be used instead of the gold-plated land. Comparison of the shear strength of the balls on the two types of the land is made every 100 cycles of the temperature cycling test. The result shows that the shear strength of bare copper lands with oxidization during the standard process of PBGA is almost as comparable as that of gold-plated lands within experimental error range. Surface analysis of the lands before ball attachment and after ball detachment is presented. A possible process development using copper wire is suggested.
机译:在这项研究中,我们着眼于可能使用塑料球栅阵列(以下简称PBGA)封装中的裸铜焊盘代替镀金焊盘的可能性。每隔100个温度循环测试循环一次,就比较两种类型的平台上球的剪切强度。结果表明,在实验误差范围内,PBGA的标准过程中裸铜焊盘的抗剪强度与镀金焊盘的抗剪强度几乎可比。介绍了在球附着之前和球脱离之后的平台的表面分析。建议使用铜线进行可能的工艺开发。

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