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Impact of maximum copper content during the 3-stage process on CdS thickness tolerance in Cu(In,Ga)Se_2-based solar cell

机译:三阶段工艺中最大铜含量对基于Cu(In,Ga)Se_2的太阳能电池CdS厚度公差的影响

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摘要

The tolerance of photovoltaic performances of Cu(In,Ga)Se_2-based (CIGSe) solar cells prepared from 3-stage grown absorbers to cadmium sulfide (CdS) buffer layer thickness was investigated. We focus on the influence of the maximum Cu content y = [Cu]/([In]+[Ga]) reached during the co-evaporation process on this tolerance. By increasing the duration of the 2nd stage we varied y_(max) from 0.93±0.11 up to 1.06±0.12. Although final Cu content and CIGSe surface morphology seem to be similar for all absorbers, the photovoltaic performance of cells with higher maximum Cu content are better; moreover they tolerate much thinner CdS buffers (down to 10 nm-thick) without open circuit voltage or fill factor loss. Cells with lower y_(max) exhibit more erratic performance and J(V,T) measurements show a specific voltage distribution for thin CdS. From these results it appears possible to decrease the CdS buffer layer thickness if it is deposited on adapted absorbers.
机译:研究了由三级生长吸收剂制备的Cu(In,Ga)Se_2基(CIGSe)太阳能电池的光伏性能对硫化镉(CdS)缓冲层厚度的耐受性。我们关注于在共蒸发过程中达到的最大Cu含量y = [Cu] /([In] + [Ga])对该公差的影响。通过增加第二阶段的持续时间,我们将y_(max)从0.93±0.11更改为1.06±0.12。尽管所有吸收剂的最终Cu含量和CIGSe表面形貌似乎都相似,但最大Cu含量较高的电池的光伏性能更好。而且,它们可以承受更薄的CdS缓冲器(低至10 nm厚),而不会产生开路电压或填充因子损失。 y_(max)较低的电池表现出更不稳定的性能,J(V,T)测量显示出薄CdS的特定电压分布。从这些结果看来,如果将CdS缓冲层沉积在合适的吸收器上,则可以减小其厚度。

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  • 会议地点 San Francisco CA(US)
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    Institut des Materiaux Jean Rouxel (IMN), Universite de Nantes, CNRS - UMR 6502 2 rue de la Houssiniere, BP 32229, 44322 Nantes cedex 3, France;

    Institut des Materiaux Jean Rouxel (IMN), Universite de Nantes, CNRS - UMR 6502 2 rue de la Houssiniere, BP 32229, 44322 Nantes cedex 3, France;

    Institut des Materiaux Jean Rouxel (IMN), Universite de Nantes, CNRS - UMR 6502 2 rue de la Houssiniere, BP 32229, 44322 Nantes cedex 3, France;

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