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Impact of maximum copper content during the 3-stage process on CdS thickness tolerance in Cu(In,Ga)Se_2-based solar cell

机译:基于Cu(GA)SE_2的太阳能电池CDS厚度耐受性在三阶段过程中的最大铜含量的影响

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The tolerance of photovoltaic performances of Cu(In,Ga)Se_2-based (CIGSe) solar cells prepared from 3-stage grown absorbers to cadmium sulfide (CdS) buffer layer thickness was investigated. We focus on the influence of the maximum Cu content y = [Cu]/([In]+[Ga]) reached during the co-evaporation process on this tolerance. By increasing the duration of the 2nd stage we varied y_(max) from 0.93±0.11 up to 1.06±0.12. Although final Cu content and CIGSe surface morphology seem to be similar for all absorbers, the photovoltaic performance of cells with higher maximum Cu content are better; moreover they tolerate much thinner CdS buffers (down to 10 nm-thick) without open circuit voltage or fill factor loss. Cells with lower y_(max) exhibit more erratic performance and J(V,T) measurements show a specific voltage distribution for thin CdS. From these results it appears possible to decrease the CdS buffer layer thickness if it is deposited on adapted absorbers.
机译:研究了由3-阶段生长吸收剂制备的基于Cu(In,Ga)Se_2的SE_2的SE_2的SE_2的(CIGSE)太阳能电池的耐受性进行研究。研究了硫化物硫化物(CDS)缓冲层厚度。我们专注于在该公差上达到的最大Cu含量y = [Cu] /([In] + [Ga])的影响。通过提高第二阶段的持续时间,我们变化为0.93±0.11,高达1.06±0.12。尽管最终Cu含量和缩减表面形态似乎类似于所有吸收剂,但最大Cu含量最高的细胞的光伏性能更好;此外,它们可以容忍更薄的CDS缓冲器(低至10nm厚)而无需打开电路电压或填充因子丢失。 y_(max)较低的细胞表现出更不稳定的性能,并且j(v,t)测量显示了薄cd的特定电压分布。根据这些结果,如果沉积在适应的吸收器上,似乎可以降低CDS缓冲层厚度。

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