首页> 外文会议>Advances in X-ray analysis (ICDD2003) >ANALYSIS OF THE SURFACE MORPHOLOGY OF CVD-GROWNDIAMOND FILMS WITH X-RAY DIFFRACTION
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ANALYSIS OF THE SURFACE MORPHOLOGY OF CVD-GROWNDIAMOND FILMS WITH X-RAY DIFFRACTION

机译:用X射线衍射分析CVD金刚石薄膜的表面形态

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摘要

In this study the influence of the addition of nitrogen during growth of diamond films isrndetermined using small-spot X-ray diffraction techniques and compared with the morphologicalrnstructure. Phase identification showed the presence of crystalline molybdenum carbide at therninterface, as well as the incorporation of a small amount of non-diamond carbon throughout therndiamond layer. The pole figures revealed a change in texture with increasing nitrogen in the gasrnphase. The results agree well with results obtained with scanning electron microscopy and laserrnreflectometry.
机译:在这项研究中,使用小光斑X射线衍射技术确定了氮在金刚石膜生长过程中的影响,并与形态结构进行了比较。相鉴定表明在界面处存在结晶碳化钼,并且在整个金刚石层中掺入了少量非金刚石碳。极图显示出随着气相中氮含量的增加,质地发生了变化。该结果与用扫描电子显微镜和激光反射法获得的结果非常吻合。

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  • 来源
  • 会议地点 Colorado Springs CO(US);Colorado Springs CO(US);Colorado Springs CO(US)
  • 作者单位

    PANalytical, Lelyweg 1, 7602 EA Almelo, The Netherlands;

    PANalytical, Lelyweg 1, 7602 EA Almelo, The Netherlands;

    PANalytical, Lelyweg 1, 7602 EA Almelo, The Netherlands;

    Research Institute for Materials, University of Nijmegen,rnToernooiveld 1, 6525 ED Nijmegen, The Netherlands;

    Research Institute for Materials, University of Nijmegen,rnToernooiveld 1, 6525 ED Nijmegen, The Netherlands;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 X射线、紫外线、红外线;
  • 关键词

  • 入库时间 2022-08-26 13:51:57

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