首页> 外文会议>2017 International Meeting for Future of Electron Devices, Kansai >Junction-barrier Schottky diodes fabricated with very thin highly Mg-doped p-GaN(20 nm)-GaN layers grown on GaN substrates
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Junction-barrier Schottky diodes fabricated with very thin highly Mg-doped p-GaN(20 nm)-GaN layers grown on GaN substrates

机译:结势垒肖特基二极管,由在GaN衬底上生长的非常薄的高Mg掺杂p-GaN(20 nm)/ n-GaN层制成

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摘要

Low turn-on voltage junction barrier Schottky (JBS) diodes were fabricated using very thin (20 nm) and extremely highly Mg doped (2×10 cm) p-GaN layer placed on top of n-GaN epitaxial layers grown on n-GaN substrates. By omitting p-GaN layers in conventional p-GaN/p-GaN-GaN vertical p-n junction diodes, device processing has been eased and low specific on-resistances (R<;0.3 mΩcm) have been obtained.
机译:低导通电压结势垒肖特基(JBS)二极管是使用非常薄(20 nm)和极高Mg掺杂(2×10 cm)的p-GaN层制造的,该p-GaN层位于在n-GaN上生长的n-GaN外延层之上基材。通过在传统的p-GaN / p-GaN / n-GaN垂直p-n结型二极管中省去p-GaN层,简化了器件工艺,并获得了较低的比导通电阻(R <; 0.3mΩcm)。

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