Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA;
Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA;
Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA;
Random access memory; Error analysis; Sensors; Conferences; Delays; Solid state circuits;
机译:用于低压SRAM的混合锁存型失调容限检测放大器
机译:一种具有数字多偏置偏置抵消功能的低压SRAM读出放大器
机译:一个28 nm 2 Mbit 6 T SRAM,具有高度可配置的低压写能力辅助实现和基于电容器的感测放大器输入失调补偿
机译:28NM技术中低压SRAM双尾读出放大器
机译:面向未来无线应用的低压高频CMOS低噪声放大器的设计。
机译:180Vpp集成线性放大器用于高压CMOS SOI技术中的超声成像应用
机译:具有设置和保持时间为18ps的双尾锁存型电压感测放大器