首页> 外文会议>2012 IEEE 14th Electronics Packaging Technology Conference >Brittle fracture behavior and interfacial reaction of Sn-Ag-Cu solders on ENIG and ENEPIG surface finish
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Brittle fracture behavior and interfacial reaction of Sn-Ag-Cu solders on ENIG and ENEPIG surface finish

机译:Sn-Ag-Cu焊料在ENIG和ENEPIG表面处理中的脆性断裂行为和界面反应

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Brittle fracture behavior of Sn-Ag-Cu solders on ENIG and ENEPIG surface finish were evaluated with varying the metal turn over (MTO) of the Ni(P) plating solution in this study. As the MTO increased, the shear strength of the solder joints decreased. Percentage of brittle fracture increased as the MTO of Ni(P) solution increased. The solder joints on ENIG surface finish showed higher brittle fracture rate than that on ENEPIG surface finish. From TEM observation, nano-voids were observed in the Ni-Sn-P layer and the amount of nano-voids increased as the MTO of Ni(P) plating solution increased.
机译:在本研究中,通过改变Ni(P)镀液的金属翻转(MTO),评估了SnIG-Ag-Cu焊料在ENIG和ENEPIG表面的脆性断裂行为。随着MTO的增加,焊点的剪切强度降低。随着Ni(P)溶液MTO的增加,脆性断裂的百分比也增加。 ENIG表面处理的焊点比ENEPIG表面处理的焊点显示出更高的脆性断裂率。从TEM观察,在Ni-Sn-P层中观察到纳米孔,并且随着Ni(P)镀液的MTO增加,纳米孔的量增加。

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