首页> 外文会议>2010 11th International Conference on Thermal, Mechanical amp; Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE) >Wire bonding the future: a combined experimental and numerical approach to improve the Cu-wire bonding quality
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Wire bonding the future: a combined experimental and numerical approach to improve the Cu-wire bonding quality

机译:引线键合的未来:结合实验和数值方法来提高铜线键合质量

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摘要

In this paper, the Copper wirebonding technology is investigated. From a numerical point of view, the wirebonding process is modelled. Experiments on specially designed bondpads are performed in order to verify the models. As such, this leads to a thorough understanding of the wirebonding process, especially the forces that take a role during this process.
机译:本文研究了铜线键合技术。从数值的角度,对引线键合过程进行了建模。为了验证模型,在专门设计的焊盘上进行了实验。因此,这将导致对引线键合过程的彻底了解,尤其是在此过程中起作用的力。

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