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The Reliability Research of Lead-Free Solder Joint of Flip-Chip

机译:倒装芯片无铅焊点的可靠性研究

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摘要

Based on the minimum potential energy theorem and the Theory of solder joint shape, 3-D (Three-dimensional) predicting model of Flip-chip lead-free solder joints shape are established. According to different technologic parameters, the 3-D solder joint shape is predicted. The nonlinear finite element analyses of the lead-free solder joint is performed by ANSYS under thermal cycles and the stress/strain distributions within the key solder joints and the maximum plastic strain range of the solder joints are determined. Based on the calculated maximum plastic strain range, the thermal fatigue life of the Sn96.5-Ag3.5 and Sn95.5-Ag3.8-Cu0.7 solder joints are calculated using Coffin-Manson equation. Based on the results of the calculated thermal fatigue life, the rules influencing thermal fatigue life of lead-free solder joints under the different technologic parameters are derived, which can be used in the hatch design of stencil and the dimension design of pad.
机译:基于最小势能定理和焊点形状理论,建立了倒装芯片无铅焊点形状的3-D(三维)预测模型。根据不同的技术参数,可以预测3-D焊点形状。 ANSYS在热循环下对无铅焊点进行了非线性有限元分析,确定了关键焊点内的应力/应变分布以及焊点的最大塑性应变范围。根据计算出的最大塑性应变范围,使用Coffin-Manson方程计算Sn96.5-Ag3.5和Sn95.5-Ag3.8-Cu0.7焊点的热疲劳寿命。根据计算得出的热疲劳寿命的结果,推导了影响不同工艺参数下无铅焊点热疲劳寿命的规律,可用于模板的填充设计和焊盘的尺寸设计。

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