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Semiconductor device with a trench electrode provided inside a trench formed on an upper surface of the semiconductor substrate and method of manufacturing the same

机译:半导体器件具有设置在形成在半导体衬底的上表面上的沟槽内部的沟槽电极及其制造方法

摘要

According to an embodiment, a semiconductor device 1 includes a semiconductor substrate 50 including an upper surface, a trench electrode 22 provided inside a trench 20 formed on the upper surface, and a trench insulating film 21 provided between the trench electrode 22 and the semiconductor substrate 50. The semiconductor substrate 50 includes a first semiconductor layer of a first conductivity type, a lower end of the trench electrode 22 reaching the first semiconductor layer, a deep layer 19 of a second conductivity type partially provided on the first semiconductor layer in contact with the trench insulating film 21, a second semiconductor layer of the second conductivity type provided on the first semiconductor layer and on the deep layer 19 in contact with the trench insulating film 21, and a third semiconductor layer of the first conductivity type provided on the second semiconductor layer above the deep layer 19.
机译:根据一个实施例,半导体器件1包括包括上表面的半导体衬底50,沟槽电极22设置在形成在上表面上的沟槽20内,以及设置在沟槽电极22和半导体衬底之间的沟槽绝缘膜21 半导体衬底50包括第一导电类型的第一半导体层,沟槽电极22的下端到达第一半导体层,第二导电类型的深层19,第二导电类型的部分地设置在与其接触的第一半导体层上 沟槽绝缘膜21,设置在第一半导体层上的第二导电类型的第二半导体层,以及与沟槽绝缘膜21接触的深层19,以及在第二个中提供的第一导电类型的第三半导体层 深层19上方的半导体层。

著录项

  • 公开/公告号US11227916B2

    专利类型

  • 公开/公告日2022-01-18

    原文格式PDF

  • 申请/专利权人 RENESAS ELECTRONICS CORPORATION;

    申请/专利号US201815934896

  • 发明设计人 RYO KANDA;

    申请日2018-03-23

  • 分类号H01L29/06;H01L29/739;H01L29/66;H01L29/10;

  • 国家 US

  • 入库时间 2022-08-24 23:23:02

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