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METHOD FOR FILLING A GAP IN A THREE-DIMENSIONAL STRUCTURE ON A SEMICONDUCTOR SUBSTRATE

机译:用于在半导体衬底上填充三维结构中间隙的方法

摘要

This application relates to a method of filling a gap in a three-dimensional structure over a semiconductor substrate. The method may include depositing a thin film at least on a three-dimensional structure over a substrate using at least one reaction gas activated with a first radio frequency (RF) power having a first frequency, the three dimensional structure comprising a trench and/or hole. The method may also include etching the deposited thin film using at least one etchant activated with a second RF power having a second frequency lower than the first frequency. The method may further include repeating a cycle of the depositing and the etching at least once until the trench and/or hole are filled with the thin film. According to some embodiments, a thin film having substantially free of voids and/or seams can be formed in the three-dimensional structure.
机译:本申请涉及在半导体衬底上填充三维结构中的间隙的方法。 该方法可以包括使用具有第一频率(RF)功率的至少一个反应气体在衬底上至少在衬底上沉积薄膜,该反应气体具有第一频率(RF)功率,所述三维结构包括沟槽和/或 洞。 该方法还可以包括使用具有第二频率低于第一频率的第二频率的第二RF功率激活的至少一个蚀刻剂来蚀刻沉积的薄膜。 该方法还可包括重复沉积的循环和至少一次蚀刻,直到沟槽和/或孔填充有薄膜。 根据一些实施例,可以在三维结构中形成基本上不含空隙和/或接缝的薄膜。

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