首页> 外国专利> Wafer Lens Array Dicing Apparatus Including Dicing Blade for Cutting Wafer Lens Array and Method Using the Same

Wafer Lens Array Dicing Apparatus Including Dicing Blade for Cutting Wafer Lens Array and Method Using the Same

机译:晶片透镜阵列切割设备,包括用于切割晶片透镜阵列的切割刀片和使用相同的方法

摘要

Disclosed are a dicing blade for cutting a wafer lens array, and an apparatus and method for dicing a wafer lens array using the same. According to one embodiment of the present invention, in the dicing blade that is fixed to the spindle and rotates by the spindle and cuts the wafer lens array, the dicing blade has a through hole and is coupled to the spindle; A body portion having a surface and an outer circumferential surface, a side wall, a first cut portion formed so that the side wall and the outer circumferential surface face each other, and the first cut portions are arranged in an alternating form, the side wall is provided, and the side wall and the It provides a dicing blade, characterized in that it comprises a second cut portion formed to face the outer peripheral surface.
机译:公开了一种用于切割晶片透镜阵列的切割刀片,以及用于使用该晶片透镜阵列切割晶片透镜阵列的装置和方法。 根据本发明的一个实施例,在固定到主轴并由主轴旋转并切割晶片透镜阵列的切割刀片中,切割刀片具有通孔并连接到主轴; 具有表面和外圆周表面的主体部分,侧壁,形成侧壁和外周表面彼此面对的第一切割部分,并且第一切割部分以交替形式布置,侧壁 提供,并且侧壁和它提供了一种切割刀片,其特征在于它包括形成为面向外周表面的第二切割部分。

著录项

  • 公开/公告号KR102279726B1

    专利类型

  • 公开/公告日2021-07-20

    原文格式PDF

  • 申请/专利权人 한국광기술원;

    申请/专利号KR20190118491

  • 发明设计人 김대근;최주현;김선훈;황연;

    申请日2019-09-26

  • 分类号H01L21/67;B26D1/14;H01L21/68;H01L21/683;H01L21/78;H01L23;

  • 国家 KR

  • 入库时间 2022-08-24 20:24:21

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号