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Optical system and method for performing photolithography using dynamic mask

机译:用于使用动态掩模进行光刻法的光学系统和方法

摘要

The present invention provides a dynamic mask including a light source emitting light of a first wavelength and light of a second wavelength different from each other, reflecting the light incident from the light source and two-dimensionally arranged micromirrors, and reflection from the dynamic mask a substrate on which a photoresist is applied to form an image, a photoresist that causes a photochemical reaction with respect to the light of the second wavelength without causing a photochemical reaction with respect to the light of the first wavelength; a stage on which the substrate is mounted and movable up and down; and an imaging unit displaying an image formed on a surface of a photoresist on a substrate, wherein the image in which the light of the first wavelength is formed on the surface of the photoresist includes a path from the dynamic mask to the substrate while moving the stage up and down An optical system for performing photolithography is provided, which is used to focus an optical system, and wherein the light of the second wavelength is reflected by the dynamic mask and exposed to the photoresist surface to perform photolithography.
机译:本发明提供一种动态掩模,其包括发射第一波长和彼此不同的第二波长的光的光源,反射从光源和二维布置的微镜入射的光,以及来自动态掩模A的反射施加光致抗蚀剂以形成图像的基材,使光致抗蚀剂引起相对于第二波长的光的光化学反应而不导致相对于第一波长的光的光化学反应;安装基板和上下移动的阶段;和一个成像单元,显示形成在基板上的光致抗蚀剂的表面上的图像,其中第一波长的光形成在光致抗蚀剂的表面上,包括从动态掩模到基板的路径,同时移动提供用于进行光刻法的光学系统的阶段,用于聚焦光学系统,并且其中第二波长的光被动态掩模反射并暴露于光致抗蚀剂表面以进行光刻。

著录项

  • 公开/公告号KR20210082967A

    专利类型

  • 公开/公告日2021-07-06

    原文格式PDF

  • 申请/专利权人 서울대학교산학협력단;

    申请/专利号KR20190175481

  • 发明设计人 전헌수;강민수;

    申请日2019-12-26

  • 分类号G03F9;

  • 国家 KR

  • 入库时间 2024-06-14 21:49:50

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