On-chip measuring circuit for low-voltage SRAM time parameters

摘要

On-chip measuring circuit for low voltage SRAM time parameters is characterized by incorporating a measurement control module and a time measurement module that is connected to the measurement control module, the time measurement module is controlled by the measurement control module, the measurement control module is based on an integrated memory self-test module, and the measurement control module includes a BIST control logic, a BIST test vector generation logic and a time measurement control module, and the time measurement module includes a delay unit, a computer and an accumulator.