CIRCUIT DEVICE WHICH INCLUDES A CONTROL CIRCUIT AND A PLURALITY OF ON-CHIP MONITOR CIRCUITS FOR MEASURING PARAMETER OF A SEMICONDUCTOR CHIP AND A METHOD FOR MANAGING THE PLURALITY OF ON-CHIP MONITOR CIRCUITS

摘要

PURPOSE: A circuit device and a method for managing a plurality of on-chip monitor circuits are provided to receive a measurement result from one or more on-chip monitor circuits and to control the calibration of other on-chip monitor circuit according to the measurement result.;CONSTITUTION: A plurality of on-chip monitor circuits(102,104) measures parameter of a semiconductor chip. A controller(106) is connected to the plurality of on-chip monitor circuits. The controller receives a measuring result from one or more on-chip monitor circuits. The controller controls the calibration of other on-chip monitor circuit according to the measurement result. The plurality of on-chip monitor circuits comprises a first on-chip monitor circuit and a second on-chip monitor circuit.;COPYRIGHT KIPO 2013;[Reference numerals] (102,104) On-chip monitor circuit; (106) Control circuit