On-chip measuring circuit for timing parameters of low voltage SRAM

摘要

On-chip measuring circuit for time parameters of low-voltage SRAM, characterized in that it contains a measurement control module and a time measurement module, the time measurement module is connected to the measurement control module, the time measurement module is controlled by the measurement control module, the measurement control module is based on an integrated memory self-test module, and the Measurement control module comprises a BIST control logic, a BIST test vector generation logic and a module for time measurement control, and the time measurement module comprises a delay unit, a comparator and an accumulator.