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Polishing liquid composition for silicon wafer or polishing liquid composition kit for silicon wafer

机译:用于硅晶片的硅组合物或用于硅晶片的抛光液组合物试剂盒

摘要

To provide a composition for a silicon wafer polishing liquid and a composition kit for a silicon wafer polishing liquid, capable of stably reducing surface roughness (haze) and surface defect (LPD) on a polished silicon wafer surface.SOLUTION: A composition for a silicon wafer polishing liquid of the present invention is obtained by mixing a silica particle dispersion containing a silica particle, a basic compound and an aqueous medium and an additive solution containing a water-soluble polymer compound and an aqueous medium. The silica particle dispersion is obtained by keeping a mixed liquid with a pH at 25°C of 9 or more and 11 or less for one day or more at 10°C or above and 80°C or below, the mixed liquid being obtained by mixing the silica particle, the basic compound and the aqueous medium, or the silica particle dispersion has a transmittance of light with a wavelength of 600 nm of 5.0% or more and 30% or less in one of cases where the content of the silica particle thereof is 5 mass% or more and 20 mass% or less.SELECTED DRAWING: None
机译:为硅晶片抛光液和用于硅晶片抛光液的组成试剂盒提供一种组合物,能够在抛光的硅晶片表面上稳定地降低表面粗糙度(雾度)和表面缺陷(LPD)。溶液:硅的组合物本发明的晶片抛光液是通过混合含有二氧化硅颗粒的二氧化硅颗粒分散体,碱性化合物和含有水溶性聚合物化合物和含水介质的添加剂溶液而获得的。通过在10℃或更高的10℃或更高的25℃下将混合液体保持在25℃或更高的25℃或更高的含有pH的混合液体来获得二氧化硅颗粒分散溶液。通过混合二氧化硅颗粒,碱性化合物和含水介质,或二氧化硅颗粒分散体的透射率在二氧化硅颗粒的含量的情况下,其中波长为600nm的波长为5.0%以上,30%或更低其是5质量%以上和20质量%或更少。选择绘图:无

著录项

  • 公开/公告号JP6836671B2

    专利类型

  • 公开/公告日2021-03-03

    原文格式PDF

  • 申请/专利权人 花王株式会社;

    申请/专利号JP20200016543

  • 发明设计人 三浦 穣史;

    申请日2020-02-03

  • 分类号H01L21/304;B24B37;C09K3/14;

  • 国家 JP

  • 入库时间 2024-06-14 21:20:32

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