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Substrate processing method, pressure control device and substrate processing system

机译:基板处理方法,压力控制装置和基板处理系统

摘要

PROBLEM TO BE SOLVED: To provide a substrate processing method, a pressure control device and a substrate processing system for expanding a pressure control range in a chamber. SOLUTION: In a substrate processing system 1, a chamber 10, a gas supply unit for supplying a processing gas to the chamber, a first pipe 81 for low pressure control, a first APC valve 82, a turbo molecular pump 83, a first. The first exhaust line L1 in which the isolate valve 84 and the dry pump 85 are arranged, and the second isolate valve 86, the second APC valve 87 and the dry pump 85 are arranged in the second pipe 80 of the high pressure control. The route has a second exhaust line L2. The second pipe has a smaller cross-sectional area than the first pipe. Switching between low pressure control and high pressure control is controlled by the control unit. [Effect] This makes the pressure in the chamber 10 mTorr to 100 Torr or more, including the pressure higher than 800 mTorr, which was difficult in the past. It can be controlled in a wide pressure band. [Selection diagram] Fig. 2
机译:要解决的问题:提供基板处理方法,压力控制装置和用于在腔室中扩展压力控制范围的基板处理系统。解决方案:在基板处理系统1中,腔室10,用于向腔室供应处理气体的气体供应单元,用于低压控制的第一管81,第一APC阀82,涡轮分子泵83,第一。第一排气管线L1,其中隔离阀84和干泵85被布置,第二隔离阀86,第二APC阀87和干泵85布置在高压控制的第二管80中。该路线具有第二排气管线L2。第二管子具有比第一管较小的横截面积。低压控制与高压控制之间的切换由控制单元控制。 [效果]这使得腔室10 mtorr到100托或更高的压力,包括高于800 mtorr的压力,过去难以。它可以在宽压带中控制。 [选择图]图2

著录项

  • 公开/公告号JP2021034725A

    专利类型

  • 公开/公告日2021-03-01

    原文格式PDF

  • 申请/专利权人 東京エレクトロン株式会社;

    申请/专利号JP20200131891

  • 发明设计人 三浦 和幸;網倉 紀彦;

    申请日2020-08-03

  • 分类号H01L21/3065;H01L21/205;C23C16/44;

  • 国家 JP

  • 入库时间 2022-08-24 17:24:44

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