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Dielectrically isolated integral silicon diaphram or other semiconductor product

机译:电介质隔离的整体式硅膜或其他半导体产品

摘要

A dielectrically isolated, pressure responsive silicon diaphragm includes a single crystal substrate bonded to a single crystal strain gage component with an intermediate insulating layer and glass bonding layer. The boric oxide enriched glass has a lower softening temperature than the insulating layer and semiconductor and a matching expansion coefficient. Illustratory products are integral silicon diaphragms, integrated circuits, and power devices for high temperature applications where junction isolation is useless. In the method of fabrication the composite is bonded at elevated temperature under pressure and the temporary substrate is removed mechanically and by a final preferential etch. Active components with thinner semi-conductor layers of uniform thickness can be produced.
机译:介电隔离的压力响应硅膜片包括单晶衬底,该单晶衬底结合到具有中间绝缘层和玻璃结合层的单晶应变仪组件。富含氧化硼的玻璃的软化温度低于绝缘层和半导体的软化温度,并且具有匹配的膨胀系数。说明性产品是集成硅膜片,集成电路和功率器件,用于结点隔离无用的高温应用。在制造方法中,将复合物在升高的温度和压力下结合,并且通过机械方式和通过最终的优先蚀刻来去除临时基板。可以生产出具有均匀厚度的较薄半导体层的有源组件。

著录项

  • 公开/公告号US3922705A

    专利类型

  • 公开/公告日1975-11-25

    原文格式PDF

  • 申请/专利权人 GENERAL ELECTRIC COMPANY;

    申请/专利号US19740527550

  • 发明设计人 YERMAN;ALEXANDER J.;

    申请日1974-11-27

  • 分类号H01L29/84;H01L29/96;

  • 国家 US

  • 入库时间 2022-08-23 01:38:37

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