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Semiconductor device with two layers of opposite conductivity - has one layer with zone of reduced thickness peripherally surrounding semiconductor device (NL 23.12.77)

机译:具有两层相反电导率的半导体器件-具有一层厚度减小的区域,周围围绕半导体器件(NL 23.12.77)

摘要

A junction is produced between the two semiconductor layers. Two ideal, single-dimensional depletion thickness region in the two layers. In order to increase the device breakdown voltage, it has a relatively thin zone (28) in the first semi-conductor layer (24) which surrounds the device. A zone of a relatively constant thickness (Y), smaller than the thickness of the single-dimensional depletion region in the first semiconductor layer (24). This relatively thin zone (28) has a width at least equal to half the coupling distance of the pn-junction. Preferably the semi-conductor layers have different impurity concentrations. The pre-junction may be flat or planar.
机译:在两个半导体层之间产生结。两层中有两个理想的一维耗尽层厚度区域。为了增加器件击穿电压,其在围绕器件的第一半导体层(24)中具有相对较薄的区域(28)。具有相对恒定的厚度(Y)的区域,该区域小于第一半导体层(24)中的一维耗尽区的厚度。该相对较薄的区域(28)的宽度至少等于pn结的耦合距离的一半。优选地,半导体层具有不同的杂质浓度。该预结可以是平坦的或平面的。

著录项

  • 公开/公告号FR2356276B1

    专利类型

  • 公开/公告日1983-02-04

    原文格式PDF

  • 申请/专利权人 GENERAL ELECTRIC CY;

    申请/专利号FR19770018467

  • 发明设计人

    申请日1977-06-16

  • 分类号H01L29/06;H01L21/302;

  • 国家 FR

  • 入库时间 2022-08-22 10:02:42

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