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TWO-BEAM INTERFERENCE TYPE LINEAR ENCODER

机译:两光束干扰型线性编码器

摘要

PURPOSE:To obtain the linear encoder which measures the length of a body, the depth of a hole, a movement distance, etc., with high accuracy by utilizing the principle of a two-beam interferometer, specially, a Mickelson interferometer. CONSTITUTION:The moving-side reflection system 14' of the two-beam interference type linear encoder 20A consists of reverse traveling reflectors, e.g. corner cubes 14B, 14C, and 14D and a plane mirror 14E. The reverse traveling reflectors 14B and 14D are arranged in a Y direction on a linearly movable rack 14A which is moved linearly by a driving mechanism while having their reflecting surfaces on the sides of while luminous flux and laser luminous flux which are split by a beam splitter 11. The fixed corner cube 14C and fixed plane mirror 14E are arranged in the Y direction outside the moving rack 14A and photodetect and reflect 2nd luminous flux which is reflected by those corner cubes 14B and 14D toward the corner cube 14D. Interference figures (a) and (b) are obtained by detectors 28 and 32. The interference figure (a) of the laser light can be utilized as an accurate scale for measuring a movement distance, etc.
机译:目的:通过利用两光束干涉仪,特别是米克尔森干涉仪的原理,获得一种可以高精度地测量物体的长度,孔的深度,移动距离等的线性编码器。组成:两光束干涉型线性编码器20A的移动侧反射系统14'由反向行进的反射器组成,例如:直角立方体14B,14C和14D以及平面镜14E。反向行进反射器14B和14D在Y方向上布置在通过驱动机构线性移动的线性可移动架14A上,同时其反射面在由光束分离器分开的光束和激光光束的侧面上。 11.固定角cube镜14C和固定平面镜14E在Y方向上配置在移动架14A的外侧,对由那些角cube镜14B,14D反射的第二光束向角cube镜14D进行光检测和反射。干涉图(a)和(b)由检测器28和32获得。激光的干涉图(a)可以用作测量运动距离等的精确标尺。

著录项

  • 公开/公告号JPH01221602A

    专利类型

  • 公开/公告日1989-09-05

    原文格式PDF

  • 申请/专利权人 JAPAN SPECTROSCOPIC CO;

    申请/专利号JP19880048186

  • 发明设计人 SHIROWACHI KIKUO;NISHIZAWA SEIJI;

    申请日1988-03-01

  • 分类号G01D5/26;G01B9/02;

  • 国家 JP

  • 入库时间 2022-08-22 06:43:17

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