SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, INSPECTING METHOD, PREPAIRING METHOD AND USING METHOD THEREOF

摘要

PURPOSE:To facilitate an inspection and to inspect the entire device even if a power source trouble exists in a functional block by providing a plurality of functional blocks connected to a common power source through branch power lines, and electrically separating the block having the trouble from the common power source. CONSTITUTION:An inspecting device is connected to a signal bus. Thus, functional blocks 1 can be individually inspected by the device through the bus. Since the device is not, if once connected, necessarily disconnected until an inspection is finished, the sequential movement, alignment, contact of an inspection needle are not required, and a high speed inspection is conducted. The branch power line 5, of the block 1' in which a power source is short-circuited at 2 is disconnected at 6 thereby to return the power source voltage drop due to the short-circuit 2 to a normal voltage. Accordingly, other block having no trouble can be inspected. Thus, the inspection is facilitated, and the inspection of the function particularly when the power source trouble occurs can be facilitated.