首页> 外国专利> SEMICONDUCTOR INTEGRATED CIRCUIT PACKAGE, SEMICONDUCTOR APPARATUS PROVIDED WITH A PLURALITY OF SEMICONDUCTOR INTEGRATED CIRCUIT PACKAGES, METHOD OF INSPECTING SEMICONDUCTOR INTEGRATED CIRCUIT PACKAGE AND METHOD OF FABRICATING SEMICONDUCTOR INTEGRATED CIRCUIT

SEMICONDUCTOR INTEGRATED CIRCUIT PACKAGE, SEMICONDUCTOR APPARATUS PROVIDED WITH A PLURALITY OF SEMICONDUCTOR INTEGRATED CIRCUIT PACKAGES, METHOD OF INSPECTING SEMICONDUCTOR INTEGRATED CIRCUIT PACKAGE AND METHOD OF FABRICATING SEMICONDUCTOR INTEGRATED CIRCUIT

机译:半导体集成电路包,具有多个半导体集成电路包的半导体装置,检查集成电路集成电路包的方法以及制造半导体集成方法

摘要

The present invention provides a resin-sealed semiconductor IC package of a large integration size having a size substantially equal to that of its component semiconductor IC chip. The resin-sealed semiconductor IC package comprises a semiconductor IC chip, a plurality of leads arranged on the semiconductor IC chip and having end portions bent so as to extend perpendicularly to the major surface of the semiconductor IC chip, a resin molding sealing the semiconductor IC chip and the leads therein so that the tips of the end portions of the leads are exposed on one surface thereof, and conductive elements connected respectively to the exposed tips of the leads.
机译:本发明提供了具有大的集成尺寸的树脂密封的半导体IC封装,其尺寸基本上等于其组件半导体IC芯片的尺寸。树脂密封的半导体IC封装件包括:半导体IC芯片;多个引线,其布置在半导体IC芯片上并且具有弯曲的端部以垂直于半导体IC芯片的主表面延伸;树脂模制件,密封半导体IC。芯片和其中的引线,使得引线的端部的末端在其一个表面上暴露,并且导电元件分别连接到引线的暴露的末端。

著录项

  • 公开/公告号US6531769B2

    专利类型

  • 公开/公告日2003-03-11

    原文格式PDF

  • 申请/专利权人 OKI ELECTRIC INDUSTRY CO. LTD.;

    申请/专利号US19990283181

  • 发明设计人 TADASHI YAMAGUCHI;

    申请日1999-04-01

  • 分类号H01L234/80;

  • 国家 US

  • 入库时间 2022-08-22 00:06:59

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