首页> 外文会议>Advanced Technology Workshop and Tabletop Exhbition on Packaging the Next Generation of Nano Devices >Standard Measurement Methods for Enabling 3D Stacked Integrated Circuits Advanced Technology Workshop and Tabletop Exhibits on Packaging the Next Generation of Nano Devices - (PPT)
【24h】

Standard Measurement Methods for Enabling 3D Stacked Integrated Circuits Advanced Technology Workshop and Tabletop Exhibits on Packaging the Next Generation of Nano Devices - (PPT)

机译:用于启用3D堆叠集成电路的标准测量方法先进的技术研讨会和桌面展示展示下一代纳米器件 - (PPT)

获取原文

摘要

First activity of the Thin Wafer Handling Task Force of 3DS-IC Committee; Thin Wafers on Tape Frames, providing guidance for choosing shipping solutions, including guidance on evaluating such shipping solutions; Experimental; Modeling.
机译:薄晶圆处理3DS-IC委员会的第一次活动;磁带框架上的薄晶片,为选择运输解决方案提供指导,包括评估此类运输解决方案的指导;实验;造型。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号