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PHYSICAL DESIGN SYMMETRY AND INTEGRATED CIRCUITS ENABLING THREE DIMENTIONAL (3D) YIELD OPTIMIZATION FOR WAFER TO WAFER STACKING

机译:物理设计对称性和集成电路可实现晶圆对晶圆堆叠的三维(3D)产量优化

摘要

One of the wafers in a semiconductor wafer to wafer stack can be rotated a predefined number of positions, relative to a previous wafer in the stack, and bonded in the position in which the maximum number of good die are aligned. An adjustment circuit on each die reroutes signals received from a pad that has been relocated due to rotation. A communication channel formed from a pair of pads that are interconnected by a Through Substrate Vias can be placed in each die and can convey selected information from one die to the next. A code representative of the position orientation of each die can be recorded in a Programmable Read Only Memory located on each die, or may be down loaded from a remote source. Any additional wafer may be stacked serially, and each one may be rotated relative to the wafer that precedes it in the stack.
机译:相对于堆叠中的先前晶片,半导体晶片到晶片堆叠中的晶片之一可以旋转预定数量的位置,并且在最大数量的良好管芯对准的位置中键合。每个芯片上的调整电路会重新路由从因旋转而被重新定位的焊盘接收的信号。由通过衬底通孔互连的一对焊盘形成的通信通道可以放置在每个管芯中,并且可以将选定的信息从一个管芯传送到下一个管芯。代表每个芯片位置定位的代码可以记录在每个芯片上的可编程只读存储器中,也可以从远程源下载。可以依次堆叠任何其他晶片,并且可以相对于堆叠中位于其之前的晶片旋转每个晶片。

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