METHOD OF X-RAY DIFFRACTION ANALYSIS OF GRAIN-ORIENTED MATERIALS

摘要

the invention u043au0430u0441u0430u0435u0442u0441u00a0 u0440u0435u043du0442u0433u0435u043du043eu0441u0442u0440u0443u043a - u0442u0443u0440u043du043eu0433u043e analyses of specific ways u0438u0441u0441u043bu0435u0434u043eu0432u0430u043du0438u00a0 u0442u0435u043au0441u0442u0443u0440u043eu0432u0430u043du043du044bu0445 materials. the purpose is to improve the reliability of the u0438u0437u043eu0431u0440u0435u0442u0435u043du0438u00a0 analysis.controlled sample're injecting beam characteristic x-ray u0438u0437u043bu0443u0447u0435u043du0438u00a0 and register them u0448u043bu0447u0447u0435u0438u0438u0435 u0434u0438u0444u0440u0430u0433u0438u0440u043eu0432u0430u043du043du043eu0435 not less than two u043fu043eu0440u00a0u0434u043au043eu0432 reflected u0438u00a0, u043fu0440u043eu0438u0437u0432u043eu0434u00a0 continuous rotation of u043du043eu0440u043cu0430u043bu0438 to u043eu0431u043bu0443u0447u0430u0435u043cu043eu0439 surface and tilting around an axis lying in the equatorial plane. the angular velocity u0432u0440u0430u0449u0435u043du0438u00a0 sh & amp; and the inclination of the u0448u043d u0441u0432u00a0u0437u0430u043du044b ratio, 2 /.Tarrs - /, / u - o.s - (-) (x Xsin / 2arctg (h / 2RsmQ). where h is the reception slot detector; r u0440u0430u0434u043d u0441u0433u043eu043du0438u043eu043cu0435u0442u0440u0430, - u0431u0440u0435u0433u0433u043eu0432u0441u043au0438u0439 angle. yu to / with