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Thin decoupling capacitor for mounting under integrated circuit package

机译:薄的去耦电容器,用于安装在集成电路封装下

摘要

A rugged, highly reliable, leadless decoupling capacitor is provided which may be positioned between a circuit board and an integrated circuit package including, for example, a leaded surface mounted IC package or Pin Grid Array package. This decoupling capacitor is comprised of a rugged ceramic or like substrate having printed or otherwise applied thereon a very thin high capacitance layer made by thick or thin film processes which is sandwiched between two thin electrode layers. Conductive castellations extend from the electrode layers along the surface of the ceramic substrate for connection to the circuit board. Preferably, an electrically insulative protective layer encapsulates the capacitor. The dielectric layer preferably comprises a high dielectric glass/ceramic dielectric paste or dielectric sol-gel layer. The overall thickness of the decoupling capacitor may be less than 0.020 inch.
机译:提供一种坚固的,高度可靠的无引线去耦电容器,其可以位于电路板和集成电路封装之间,该集成电路封装包括例如引线表面安装的IC封装或Pin Grid Array封装。该去耦电容器由坚固的陶瓷或类似的基板组成,该基板上印刷或以其他方式施加有通过厚或薄膜工艺制成的非常薄的高电容层,该高电容层夹在两个薄电极层之间。导电城堡形结构从电极层沿着陶瓷基板的表面延伸,以连接至电路板。优选地,电绝缘保护层封装电容器。介电层优选包括高介电玻璃/陶瓷介电浆料或介电溶胶-凝胶层。去耦电容器的总厚度可以小于0.020英寸。

著录项

  • 公开/公告号US5034850A

    专利类型

  • 公开/公告日1991-07-23

    原文格式PDF

  • 申请/专利权人 ROGERS CORPORATION;

    申请/专利号US19900479095

  • 发明设计人 JORGE M. HERNANDEZ;ANDREW B. FEINBERG;

    申请日1990-02-12

  • 分类号H01G1/14;H01G4/10;

  • 国家 US

  • 入库时间 2022-08-22 05:46:10

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