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SEMCONDUCTOR INTEGRATED CIRCUIT HAVING A TEST CIRCUIT
SEMCONDUCTOR INTEGRATED CIRCUIT HAVING A TEST CIRCUIT
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机译:半导体集成电路正在测试的电路
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摘要
A semiconductor integrated circuit has a discrimination circuit connected between power source terminals (VDD,VSS) and three input terminals (IN1-IN3), the discrimination circuit discriminating specific operating modes with option functions. The discrimination circuit includes a voltage limiter (22) for limiting an input potential applied to the input terminals in opposition to the power sources, to a predetermined input logic level and an option means (24) connected to the limiter (22) to determine the current flow of the limiter (22) in a chip manufacturing process.
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