INTEGRATED CIRCUIT ASSEMBLED BY TEST CIRCUIT, INTEGRATED CIRCUIT DEVICE HAVING THE TEST CIRCUIT AND TEST BOARD AND TESTING METHOD FOR THE INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To suppress minimum the disadvantage caused by testing such as having too many elements of a test circuit containing in LSI and occurrence of a delay time in the case of testing and LSI with multiple pins using an LSI tester with small number of pins. ;SOLUTION: In the case this device is provided with test circuits 111 to 113 having try-state buffers connected respectively to output terminals in an LSI circuit having 2m output terminals, an LSI 101 containing input buffers 151 and 152 for inputting control signals A and B to the try-state buffers and a test board 102 connecting to m tester pins 1 to m by short-circuiting every two output terminals of the try-state buffers and connecting the input buffers 151 and 152 and tester pins A and B, respectively, the output state of the try- state buffers are changed over in test mode with the control signals A and B. Then, one of output signals 11, 21,...m1 or 12, 22,...m2 of the LSI internal circuit 110 is selected to input in an LSI tester 1-3 and to test.;COPYRIGHT: (C)1998,JPO