The present invention relates to an installation for studying the surface of samples placed in a vacuum or in a controlled atmosphere, of the type comprising a main enclosure in which a support plate is placed for at least one device, called SXM, intended for microscopy, spectroscopy or etching of the surface of samples, according to a method implementing a scanning of said surface by a tip that conducts electricity or light, said installation being characterized in that the stage support can be disengaged from the main enclosure and turned on itself around a central axis to allow the use of a set of SXM devices arranged at the periphery of said plate. It applies in particular to microscopy and / or spectroscopy with an electronic tunnel effect, in particular in the ultra-vacuum, to microscopy and / or spectroscopy with an optical tunnel effect, or else to the etching of nanometric structures by optical microlithographic processes. and / or electronic.
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