Testing performance of integrated circuit structure(s) - using test signal generator applying standard test data for output comparison and analysis

摘要

A test signal generator (2) applies a series of test data conforming to a standard test matrix to the input of the IC under test (1) and the resultant output is registered by a comparator (4). The generator (2) also provides coded analytical data to a module (3) where they are decoded and the signals subjected to a delay line for reasons of synchronisation with the output test data from the IC (1) before entering the comparator (4). The two sets of output data are checked for agreement in the comparator (4) to establish correct performance of the IC (1). USE/ADVANTAGE - Testing digital signal performance of complex integrated circuits, e.g. for sync. digital hierarchy systems. Suitable for automatic quality control during mfr.