Electronic circuit testing method in which electronic circuits to be tested are compared with a reference circuit by application of test signals and comparison of the resultant output signals

摘要

Method for testing an electronic circuit (8) according to value ranges given in a specification has the following steps: selection of a fault-free reference circuit (7); simultaneous provision of test signals to both reference and under test circuits; output of output signals from reference and under test circuits; comparison of the output signals and; generation of error data based on the result of the output data comparison. An independent claim is made for a testing device for testing an electronic circuit.