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Test socket assembly for testing LCC packages of both rectangular and square configuration

机译:测试插座组件,用于测试矩形和正方形配置的LCC封装

摘要

A universal LCC test socket assembly for making solderless connections between the leads of either a rectangular or square configured LCC packaged IC and a testing device includes a top member having spring biased securing members for temporarily securing a LCC packaged IC, and a base member including a plurality of electrical contacts that extend beyond the base member for electrical connection to the testing device.
机译:一种通用LCC测试插座组件,用于在矩形或正方形LCC封装IC的引线与测试设备之间进行无焊接连接,包括顶部部件和底部部件,顶部部件具有用于临时固定LCC封装IC的弹簧偏置固定部件。多个电触头延伸超出基座构件,以电连接至测试装置。

著录项

  • 公开/公告号US5329227A

    专利类型

  • 公开/公告日1994-07-12

    原文格式PDF

  • 申请/专利权人 ARIES ELECTRONICS INC.;

    申请/专利号US19930063528

  • 发明设计人 WILLIAM Y. SINCLAIR;

    申请日1993-05-18

  • 分类号G01R1/04;

  • 国家 US

  • 入库时间 2022-08-22 04:31:28

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