首页> 外国专利> MICROWAVE ENERGIZED DEPOSITION PROCESS WITH SUBSTRATE TEMPERATURE CONTROL

MICROWAVE ENERGIZED DEPOSITION PROCESS WITH SUBSTRATE TEMPERATURE CONTROL

机译:具有基体温度控制的微波激励沉积过程

摘要

Substrate temperatures are maintained above 400 DEG C. During the microwave energized glow discharge deposition of Group IV semiconductor materials. The substrate temperature range provides for the preparation of materials having improved electrical properties. Cell efficiency of a photovoltaic device of the p-i-n type is significantly improved by depositing the intrinsic layer using a microwave generated plasma and a substrate temperature in excess of 400 DEG C. Maximum cell efficiency occurs for depositions carried out in the range of 400 DEG -500 DEG C.
机译:衬底温度保持在400℃以上。在微波激发的IV族半导体材料的辉光放电沉积期间。基材温度范围用于制备具有改善的电性能的材料。通过使用微波产生的等离子体和衬底温度超过400℃来沉积本征层,可以显着提高pin型光电器件的电池效率。对于在400℃-500℃范围内进行的沉积,最大电池效率发生了。 C级

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号