首页> 外国专利> Insulating film of semiconductor device, coating liquid for forming insulating film, and manufacturing method of insulating film

Insulating film of semiconductor device, coating liquid for forming insulating film, and manufacturing method of insulating film

机译:半导体器件的绝缘膜,用于形成绝缘膜的涂布液以及绝缘膜的制造方法

摘要

It is of course possible to obtain a good film quality, and to provide an insulating film of a semiconductor device having excellent embedding characteristics, thick film and flatness at the same time, a coating liquid for forming an insulating film for forming the insulating film, and a method of manufacturing the insulating film . On the semiconductor substrate (1) having a step, a general formula is obtained by CO hydrolysis of a triacoxysilane of SiH (or) 3, a methyltrialkoxysilane of sich3 (or) 3, and a general formula of a tetraalkoxysilane of Si (or) 4, and the solution of the polymer is the principal component After the coating liquid for forming an insulating film is coated and dried, the film is heated and hardened in an inert gas atmosphere, thereby forming an insulating film (6) comprising a silane compound having a general formula of sihx (CH3) yo2. Sup. 2 - (x + y) / 2 (but 0 x 1,0 y 1, x + y u2266 1).
机译:当然,可以获得良好的膜质量,并且可以提供同时具有优异的嵌入特性,厚膜和平坦度的半导体器件的绝缘膜,用于形成用于形成绝缘膜的绝缘膜的涂布液,以及绝缘膜的制造方法。在具有台阶的半导体衬底(1)上,通过CO水解SiH(或)3的三酰氧基硅烷,sich3(或)3的甲基三烷氧基硅烷和Si(或)的四烷氧基硅烷的通式获得通式。参照图4,以聚合物溶液为主要成分,将绝缘膜形成用涂布液涂布并干燥后,在惰性气体气氛中加热固化,从而形成包含硅烷化合物的绝缘膜(6)。具有通式sihx(CH3)yo2。 up 2-(x + y) / 2(但0

著录项

  • 公开/公告号JPWO95/18190A1

    专利类型

  • 公开/公告日1996-02-27

    原文格式PDF

  • 申请/专利权人 川崎製鉄株式会社;

    申请/专利号JP特願平7-503964

  • 发明设计人 中野 正;徳永 恭二;

    申请日1994-12-27

  • 分类号C09D183/05;H01L21/312;

  • 国家 JP

  • 入库时间 2022-08-22 04:02:47

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号