首页> 外国专利> Semiconductor device of a first conductivity type which has a first well of a second conductivity type formed therein and a second well of the first conductivity type formed in the first well and a pair of MOSFET formed in the first and second wells

Semiconductor device of a first conductivity type which has a first well of a second conductivity type formed therein and a second well of the first conductivity type formed in the first well and a pair of MOSFET formed in the first and second wells

机译:具有第一导电类型的半导体器件,该半导体器件具有形成在其中的第二导电类型的第一阱以及形成在第一阱中的第一导电类型的第二阱以及形成在第一阱和第二阱中的一对MOSFET

摘要

The present invention is directed to a CMOS inverter in which an N-FET (Qn) formed of an N-type source region (2S), a drain region (2D) and a gate electrode (2G) and a P-FET (Qp) formed of a P-type source region (3S) , a drain region (3D) and a gate electrode (3G) are formed on an N-type silicon substrate (1n). A first well region (4p) is formed under the N- FET (Qn) and P-FET (Qp). Further, an N-type well region (5n) is formed on the P-FET (Qp) within the first well region (4p). Thus, an influence exerted by a back-gate effect from the substrate can be prevented completely, whereby a phase displacement relative to a pulse response to a CMOS peripheral logic circuit and a malfunction can be avoided.
机译:本发明针对一种CMOS反相器,其中由N型源极区域(2S),漏极区域(2D)和栅电极(2G)形成的N-FET(Qn)和P-FET(Qp)在N型硅衬底(1n)上形成由P型源极区域(3S)形成的1),漏极区域(3D)和栅电极(3G)。在N-FET(Qn)和P-FET(Qp)下方形成第一阱区(4p)。此外,在第一阱区域(4p)内的P-FET(Qp)上形成N型阱区域(5n)。因此,可以完全防止衬底的背栅效应施加的影响,从而可以避免相对于对CMOS外围逻辑电路的脉冲响应的相位偏移和故障。

著录项

  • 公开/公告号US5473183A

    专利类型

  • 公开/公告日1995-12-05

    原文格式PDF

  • 申请/专利权人 SONY CORPORATION;

    申请/专利号US19940301980

  • 发明设计人 KAZUYA YONEMOTO;

    申请日1994-09-07

  • 分类号H01L29/76;H01L29/94;H01L31/062;

  • 国家 US

  • 入库时间 2022-08-22 03:39:25

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号