Used in situ and specimen for scanning electron microscopy traction.

摘要

The invention relates to a machine TRACTION IN SITU (1) and a test piece to be placed in the chamber OBSERVATION OF AN ELECTRON MICROSCOPE (SEM). And to receive the specimen. The machine consists of a rigid frame (2) on which are provided two TRACTION HEADS (3.4), one of which at least is mobile (4), each defining a housing (3A, 4A) IN which is capable of anchoring the corresponding end (9A, 9B) of the sample (9). ENSURES locking and self-alignment of the specimen. This set of traction is modular and compact, INTEGRABLE unchanged in the MEB OBSERVING CAMERA. A heating device (22) of the sample (9) may be integrated into the machine. A reversing device lets you apply a compression at a test tube.