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HGCDTE SEMICONDUCTOR DEVICE AND ITS MANUFACTURE

机译:HGCDTE半导体装置及其制造

摘要

PROBLEM TO BE SOLVED: To execute channel stop for electrically separating photodiodes without using a heat processing process by providing a negative processing layer between a coating film in an n-type area with a p-type HgCdTe layer and inducing a p+-area just below. ;SOLUTION: Boron is selectively ion-injected in a p-type HgCdTe layer and plural n-type areas 12 are formed so as to constitute a photodiode array. Then, a ZnS protection film is formed on the whole face by an evaporation method and the AnS film is patterned by etching liquid. Then, a channel stop forming area 14 is opened. Then, a thin oxygen plasma processing layer 16 accompanied by oxidation is formed on the exposed face of the p-type HgCdTe layer 11 by using an electronic cyclotron resonance plasma processor. Then, a ZnS film 13 is removed and the SiN film 17 is formed on the whole face by the CVD method. Then, the contact hole 18 is formed by dry etching and In is provided on n-side electrode and Au on a p-side electrode.;COPYRIGHT: (C)1998,JPO
机译:解决的问题:通过在具有p型HgCdTe层的n型区域中的涂膜之间提供负处理层并诱导ap + < / Sup>-下面的区域。 ;解决方案:将硼选择性离子注入p型HgCdTe层中,并形成多个n型区域12以构成光电二极管阵列。然后,通过蒸发方法在整个表面上形成ZnS保护膜,并通过蚀刻液体对AnS膜进行构图。然后,通道停止形成区域14被打开。然后,通过使用电子回旋共振等离子体处理器在p型HgCdTe层11的暴露面上形成伴随氧化的薄的氧等离子体处理层16。然后,去除ZnS膜13,并且通过CVD方法在整个面上形成SiN膜17。然后,通过干蚀刻形成接触孔18,在n侧电极上设置In,在p侧电极上设置Au。版权所有:(C)1998,JPO

著录项

  • 公开/公告号JPH1056197A

    专利类型

  • 公开/公告日1998-02-24

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP19960209525

  • 发明设计人 ARINAGA KENJI;FUJIWARA KOJI;SUDO HAJIME;

    申请日1996-08-08

  • 分类号H01L31/10;H01L31/0264;

  • 国家 JP

  • 入库时间 2022-08-22 03:04:21

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