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The Effect of Metal-Semiconductor Contact on the Transient Photovoltaic Characteristic of HgCdTe PV Detector

机译:金属-半导体接触对HgCdTe光伏探测器的瞬态光伏特性的影响

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摘要

The transient photovoltaic (PV) characteristic of HgCdTe PV array is studied using an ultrafast laser. The photoresponse shows an apparent negative valley first, then it evolves into a positive peak. By employing a combined theoretical model of pn junction and Schottky potential, this photo-response polarity changing curves can be interpreted well. An obvious decreasing of ratio of negative valley to positive peak can be realized by limiting the illumination area of the array electrode. This shows that the photoelectric effect of Schottky barrier at metal-semiconductor (M/S) interface is suppressed, which will verify the correctness of the model. The characteristic parameters of transient photo-response induced from p-n junction and Schottky potential are extracted by fitting the response curve utilizing this model. It shows that the negative PV response induced by the Schottky barrier decreases the positive photovoltage generated by the pn junction.
机译:使用超快激光研究了HgCdTe光伏阵列的瞬态光伏(PV)特性。光响应首先显示出明显的负谷,然后演变为正峰。通过使用pn结和肖特基电位的组合理论模型,可以很好地解释这种光响应极性变化曲线。通过限制阵列电极的照射面积,可以实现负谷与正峰之比的明显降低。这表明肖特基势垒在金属-半导体(M / S)界面处的光电效应被抑制,这将验证模型的正确性。通过使用该模型拟合响应曲线,可以提取由p-n结和肖特基电位引起的瞬态光响应的特征参数。它表明,肖特基势垒引起的负PV响应会降低pn结产生的正光电压。

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