首页> 外国专利> PREFERENTIAL ETCH OF SEMICONDUCTOR SUBSTRATE WITH RESPECT TO EPITAXIAL LAYERS

PREFERENTIAL ETCH OF SEMICONDUCTOR SUBSTRATE WITH RESPECT TO EPITAXIAL LAYERS

机译:与衬底层有关的半导体基质的优先蚀刻

摘要

An etching composition and method for its use in etching a semiconductor structure, the semiconductor structure comprising a substrate and one or more epitaxial layers. The etching composition comprises a solvent, an etchant, and first and second complexing agents, the etchant and complexing agents being soluble in the solvent. The etchant preferentially etches the substrate with respect to at least one epitaxial layer. The first complexing agent is reactive with the substrate so as to accelerate the rate at which the etchant etches the substrate. The second completing agent is reactive with a component of the at least one epitaxial layer so as to form a resulting compound with the component. This reaction establishes an equilibrium between the resulting compound, the second complexing agent and the component, the equilibrium precluding significant etching of the at least one epitaxial layer. The etching composition preferably comprises an agent which provides for adjusting the acidity of the solution, and thereby provides for adjusting the etch rate of the substrate while maintaining the composition's etching characteristics with respect to the at least one epitaxial layer.
机译:一种用于蚀刻半导体结构的蚀刻组合物及其方法,该半导体结构包括衬底和一个或多个外延层。该蚀刻组合物包含溶剂,蚀刻剂以及第一和第二络合剂,该蚀刻剂和络合剂可溶于该溶剂中。蚀刻剂优选相对于至少一个外延层蚀刻衬底。第一络合剂与基底反应,以加速蚀刻剂蚀刻基底的速率。第二完成剂与至少一个外延层的组分反应,从而与该组分形成所得化合物。该反应在所得化合物,第二络合剂和组分之间建立平衡,该平衡排除了至少一个外延层的显着蚀刻。蚀刻组合物优选包含提供调节溶液酸度的试剂,从而提供调节基材的蚀刻速率的试剂,同时保持组合物相对于至少一个外延层的蚀刻特性。

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