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Cleaning solution supply method of wet cleaning device for semiconductor manufacturing

机译:半导体制造用湿式清洗装置的清洗液供给方法

摘要

The cleaning solution of the wet cleaning window for semiconductor manufacturing, which improved the method of additionally supplementing the cleaning solution to the wet cleaning device configured to overflow to the external storage tank by overflowing the cleaning solution contained in the internal storage tank where the cleaning process is performed. It relates to a supply method.;The present invention relates to a wet cleaning apparatus for manufacturing a semiconductor in which a cleaning liquid contained in an internal storage tank in which a cleaning process is performed is overflowed to an external storage tank and circulated back to the internal storage tank through a filter by a forced pump of the pump. Further, the additional supply of the cleaning liquid is characterized in that by supplying each component of the cleaning liquid to the external reservoir. Therefore, the cleaning liquid is not directly supplied to the internal storage tank containing the wafer, but is supplied to the external storage tank, so that each component of the cleaning liquid is mixed so that the cleaning liquid having a uniform concentration is supplied to the internal storage tank to prevent the wafer from being damaged. There is.
机译:用于半导体制造的湿式清洁窗的清洁液,改进了通过向容纳在内部清洁槽中的清洁液溢流而配置成溢出到外部储液槽的湿式清洁装置补充清洁液的方法。被执行。本发明涉及一种用于制造半导体的湿法清洁设备,其中,在其中执行清洁过程的内部储水箱中容纳的清洁液溢流到外部储水箱中,并循环回去。内部储罐通过泵的强制泵通过过滤器。此外,清洁液的额外供应的特征在于,通过将清洁液的每种成分供应到外部储存器。因此,清洁液不直接供给到容纳晶片的内部容纳槽,而是供给到外部容纳槽,以使清洁液的各成分混合,从而将浓度均匀的清洁液供给到内部。内部存储罐,以防止损坏晶片。有。

著录项

  • 公开/公告号KR980005898A

    专利类型

  • 公开/公告日1998-03-30

    原文格式PDF

  • 申请/专利权人 김광호;

    申请/专利号KR19960021719

  • 发明设计人 정재형;윤영환;

    申请日1996-06-15

  • 分类号H01L21/341;

  • 国家 KR

  • 入库时间 2022-08-22 02:45:37

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