首页> 外国专利> Semiconductor non-volatile storage device having verification potential applying device for re-writing to insufficiently written memory cells

Semiconductor non-volatile storage device having verification potential applying device for re-writing to insufficiently written memory cells

机译:具有验证电位施加装置的半导体非易失性存储装置,用于向写得不够充分的存储单元进行重写

摘要

A semiconductor non-volatile storage device has a memory cell array including a plurality of memory cells arranged in a form of matrix. Each of the memory cells has a charge accumulation layer and a control gate stacked on a semiconductor substrate for enabling electrical updating by increasing and decreasing of charge in the charge accumulation layer. An equal level of verification potential is applied for all of bit lines of the memory cells and a predetermined verification potential is applied to a selected control gate for performing re-writing for insufficiently written memory cells without generating data for re- writing per every verification by a logic circuit.
机译:半导体非易失性存储装置具有存储单元阵列,该存储单元阵列包括以矩阵形式布置的多个存储单元。每个存储单元具有堆叠在半导体衬底上的电荷累积层和控制栅极,以通过增加和减少电荷累积层中的电荷来实现电更新。对存储单元的所有位线都施加相等级别的验证电位,并且将预定的验证电位施加到选定的控制栅极,以对写入不足的存储单元执行重写,而不会为每次验证产生用于重写的数据逻辑电路。

著录项

  • 公开/公告号US5825690A

    专利类型

  • 公开/公告日1998-10-20

    原文格式PDF

  • 申请/专利权人 NEC CORPORATION;

    申请/专利号US19960586084

  • 发明设计人 KENJI SAITOH;

    申请日1996-01-16

  • 分类号G11C16/06;

  • 国家 US

  • 入库时间 2022-08-22 02:38:21

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