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A stacked cmos sram cell with polysilicon - load transistors

机译:具有多晶硅的堆叠式cmos SRAM电池-负载晶体管

摘要

A CMOS SRAM memory cell, and a method of making the same, is disclosed. The disclosed cell is configured as cross-coupled CMOS inverters, with the n-channel pull-down transistors in bulk, and with the p-channel load devices being accumulation mode p-channel transistors in a thin polysilicon film. The cross-coupling connection is made by way of an intermediate layer, which may include polysilicon at its top surface for performance enhancement, each of which makes contact to the drain region of an n-channel transistor, and to the opposite gate electrode, via a buried contact. The intermediate layer also serves as the gate for the thin-film p-channel transistor, which has its channel region overlying the intermediate layer. The p-channel transistors may be formed so as to overlie part of the n-channel transistor in its inverter, thus reducing active chip area required for implementation of the memory cell.
机译:公开了一种CMOS SRAM存储单元及其制造方法。所公开的单元被配置为交叉耦合的CMOS反相器,其中n沟道下拉晶体管为主体,并且p沟道负载器件为在多晶硅薄膜中的累积模式p沟道晶体管。交叉耦合连接是通过中间层进行的,该中间层的顶表面可能包含多晶硅以提高性能,每个中间层都通过n接触n沟道晶体管的漏极区域和相对的栅电极。隐藏的联系人。中间层还用作薄膜p沟道晶体管的栅极,该薄膜p沟道晶体管的沟道区域覆盖中间层。可以形成p沟道晶体管,使其覆盖在其反相器中的n沟道晶体管的一部分上,从而减小了实现存储单元所需的有源芯片面积。

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