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Method for determining parameters of a unit cell of a crystal structure using diffraction
Method for determining parameters of a unit cell of a crystal structure using diffraction
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机译:使用衍射确定晶体结构的晶胞参数的方法
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摘要
A method for determining the parameters of a unit cell of a crystal structure using diffraction is presented. The method includes the steps of repeatedly rotating the crystal at a predetermined angle, while the crystal moves in relation to a detection surface and measuring the position of radiation reflected from the crystal. The resulting combined measurements are utilized to accurately determine the unit cell dimension and orientation of the crystal.
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