METHOD FOR DETERMINING PARAMETERS OF A UNIT CELL OF A CRYSTAL STRUCTURE USING DIFFRACTION

摘要

The invention relates to a method of determining parameters of a unit cell of a crystal structure using diffraction, comprising the following steps: a. directing X- or neutron rays at a crystal rotating over a predetermined angle; b. detection of the radiation reflected by the crystal on a two-dimensional detection surface; c. determining the position where the reflected radiation falls on the detection surface. The steps a, b and c are repeated, with in step a the crystal always rotating over the same angle. In the first performance of the steps a, b and c the relative movement of the crystal in relation to the detection surface is determined by only the rotation of the crystal. In a repeat-performance of the steps a, b and c the relative movement of the crystal in relation to the detection surface is determined by a rotation of the crystal identical to that of the first performance of the steps a, b and c, and by a further relative movement of the crystal in relation to the detection surface coupled thereto. The combination of the positions determined in the repeat performance of steps c determines the angle position of the crystal in relation to a reference value in which reflection of the beams occurs.