首页> 外国专利> METHOD AND APPARATUS FOR DETERMINNG A SAMPLE SHAPE BY MEASURING INCLINATION OF SURFACE WITH INJECTION TYPE ELECTRON MICROSCOPE

METHOD AND APPARATUS FOR DETERMINNG A SAMPLE SHAPE BY MEASURING INCLINATION OF SURFACE WITH INJECTION TYPE ELECTRON MICROSCOPE

机译:通过注射型电子显微镜测量表面倾斜度来确定样品形状的方法和装置

摘要

PURPOSE: A method and an apparatus for determining a sample shape by measuring an inclination of a surface with an injection type electron microscope are provided to precisely measure an inclination of a sample surface by the injection type electron microscope to determine a three-dimensional shape of the sample. CONSTITUTION: A method for determining a sample shape by measuring an inclination of a surface with an injection type electron microscope includes the steps of obtaining a plurality of electronic emission measuring values by measuring electronic emission from a part of a surface positioned at a predetermined angle for each electronic beam(20,22), and inducing a relationship between the electronic emission and the angle on the basis of the plurality of measuring values by performing a measuring steps, facing the electron beams on a position on the surface to impact on the position for obtaining a measured electronic emission, and inducing an angle from the obtained relationship from the measured electronic emission and the obtained relationship on the position to determine an inclination of the surface(24,26,28).
机译:目的:提供一种通过使用注射型电子显微镜测量表面倾斜度来确定样品形状的方法和设备,以通过注射型电子显微镜精确测量样品表面的倾斜度,从而确定样品的三维形状。这个样本。构成:一种通过使用注射型电子显微镜测量表面倾斜度来确定样品形状的方法,包括以下步骤:通过测量位于预定角度的表面部分的电子发射来获得多个电子发射测量值每个电子束(20,22),并通过执行测量步骤使电子束面对表面上的某个位置以影响该位置,并根据多个测量值在该多个测量值的基础上得出电子发射与角度之间的关系用于获得测得的电子发射,并根据测得的电子发射和位置之间的关系从所获得的关系推导角度以确定表面的倾斜度(24、26、28)。

著录项

  • 公开/公告号KR20000034930A

    专利类型

  • 公开/公告日2000-06-26

    原文格式PDF

  • 申请/专利权人 SCHLUMBERGER TECHNOLOGIES INC.;

    申请/专利号KR19990039966

  • 发明设计人 STEVEN W. INTO;

    申请日1999-09-17

  • 分类号G01B11/24;

  • 国家 KR

  • 入库时间 2022-08-22 01:45:41

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