首页> 外国专利> PHOTORESIST COMPOSITION RESIN FOR DEEP UV EXPOSUE AND MANUFACTURING METHOD THEREOF AND PHOTORESIST COMPOSITION RESIN FOR DEEP UV EXPOSURE THEREWITH

PHOTORESIST COMPOSITION RESIN FOR DEEP UV EXPOSUE AND MANUFACTURING METHOD THEREOF AND PHOTORESIST COMPOSITION RESIN FOR DEEP UV EXPOSURE THEREWITH

机译:用于深紫外线的光致抗蚀剂组成树脂及其制造方法和用于深紫外线的光致抗蚀剂组成树脂

摘要

BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a structural resin for ultraviolet photoresist composition for manufacturing a semiconductor device, a method of manufacturing the same, and a photoresist composition for ultraviolet exposure including the structural resin.;The present invention provides a norbornene-based resin as a structural resin for photoresist composition for far-ultraviolet exposure that can be exposed using ultraviolet rays as a light source in a photolithography process during the manufacturing of a semiconductor device. The manufacturing method of this and the photoresist composition for ultraviolet-ray exposure containing this norbornene-type resin are provided.;Therefore, there is an effect of providing a photoresist composition for far ultraviolet rays, which has sufficient transmittance even in about 193 nm ultraviolet ray, is excellent in etching resistance, is clear in pattern contrast during development, and exhibits high resolution.
机译:技术领域[0001]本发明涉及一种用于制造半导体器件的紫外线光致抗蚀剂组合物的结构树脂,其制造方法以及包括该结构树脂的用于紫外线曝光的光致抗蚀剂组合物。本发明提供了一种降冰片烯类树脂,作为用于远紫外线曝光的光致抗蚀剂组合物的结构树脂,其可以在制造半导体器件的光刻工艺中使用紫外线作为光源进行曝光。提供了其制造方法以及含有该降冰片烯系树脂的紫外线曝光用光致抗蚀剂组合物。因此,具有提供即使在约193nm的紫外线下也具有足够的透射率的远紫外线用光致抗蚀剂组合物的效果。射线具有优异的耐蚀刻性,显影时的图案对比度清晰,并且显示高分辨率。

著录项

  • 公开/公告号KR100240024B1

    专利类型

  • 公开/公告日2000-01-15

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO LTD.;

    申请/专利号KR19970017741

  • 发明设计人 이성호;송호종;

    申请日1997-05-08

  • 分类号G03F7/004;

  • 国家 KR

  • 入库时间 2022-08-22 01:45:06

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